R&S®ZVB Vector Network Analyzers (Rohde & Schwarz International - Products & Services - Test & Measurement - Product Categories

Features

Wide range of functions for increased throughput

The new platform of the R&S^®ZVB employs a fundamental mixing concept that has proven successful in the R&S^®ZVR series of vector network analyzers for more than ten years and that ensures a wide dynamic range of up to 123 dB and low trace noise better than 0.01 dB. Measurement bandwidths range from 1 Hz to 500 kHz. A frequency sweep covering 201 test points takes less than 8 ms at a bandwidth of 500 kHz.

Measurement speed can be further optimized by means of a segmented sweep. This function allows you to divide a sweep into as many segments as you like, their number being limited only by available RAM size. Sweep parameters such as the number of test points, the test point spacing, the measurement bandwidth, and the source level can be defined separately for each segment and thus accurately adapted to the DUT characteristic.

Dialog for defining a segmented sweep

Different setups can be stored on hard disk and loaded into RAM as required. Several setups at a time can be loaded into RAM. Since all data of loaded setups, including calibration data, is already in RAM, you can switch between setups (setup swapping) virtually without delay, i.e. in less than 10 ms by remote control. With conventional instruments, recalling setups can take up to one second. Each setup is represented by a separate measurement window. In manual operation, you can switch between windows by using the mouse or pressing a key.

Setup swapping

Trace data is transferred via the IEC/IEEE bus or LAN at the same time measured data is being captured, which means that data transfer time on the R&S^®ZVB is insignificant.

The multigenerator concept of the R&S^®ZVB allows test ports to be organized in groups. Each test port group carries out measurements independently of the other groups; the measurements of all groups are performed simultaneously, provided the test parameters are identical for each group. This allows several DUTs, or several paths of one DUT, to be measured in parallel. The dialog for defining test port groups is shown below.